| 摘要 |
The holding frame (11,15) for testing a PCB (3) supports the item under test on both sides. It uses an electrical contact system of probes (10) on positioning arms (5) set according to the process. The test object may be supported by a plate (15) on one side (13) with channels (17) for insertion of the probes and, since the holding frame is electrically non-conductive, have a metal foil (21) which can be pierced by the contact probes on its upper surface (19). Alternatively, the system holding the test object in place with the contact equipment may consist of suction clamps held at right-angles to the test object by the positioning arms. These may be activated or deactivated by a control unit. Both systems ensure that the test object is held firmly and accurately positioned for the contact probes. |
