发明名称 Molding die for sealing semiconductor device with reduced resin burrs
摘要 A molding die for sealing a semiconductor element with a resin includes an upper and a lower mold half. A leadframe having a resin passage aperture is sandwiched between the lower mold half and the upper mold half. The lower mold half has a lower runner space, a lower cavity, and a lower gate provided between the lower runner space and the lower cavity. The upper mold half has an upper resin well, an upper cavity, and an upper gate provided between the resin well and the upper cavity. The length of the upper resin well in the direction of the flow of resin is equal to or greater than the distance from the lower gate to the front edge of a lower runner rising slope, to thereby obtain a final product which is free from resin burrs formed in the upper resin well.
申请公布号 US5635220(A) 申请公布日期 1997.06.03
申请号 US19950530425 申请日期 1995.09.19
申请人 NEC CORPORATION 发明人 IZUMI, ATSUHIKO;INABA, TAKEHITO;AZUMA, KOUSUKE
分类号 B29C45/26;B29C45/02;B29C45/14;B29L31/34;H01L21/56;H01L23/50;(IPC1-7):B29C45/02 主分类号 B29C45/26
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