| 摘要 |
<p>A plurality of electrical circuit components (22) having capacitance, e.g. ceramic capacitors, are tested simultaneously in a corresponding plurality of test channels. They are stressed by a variable voltage source (10) that can produce an electrical potential selected from a wide range from low potential to high potential. The charge current by which a component accumulates a charge is controlled to a selected linear rate by a current controller (16). Voltage sensors (28) and current sensors (18) measure accumulated charges and leakage current, respectively. The current sensor (18) can be selectively sensitized to a plurality of anticipated leakage current ranges. In addition, the selected potentials can each be applied to the components (22) in a single step or can be applied over time in ramp fashion. A processor can be used for running at least a prescribed test process on components (22), the processor being operatively coupled to, for controlling and receiving inputs from, the above elements.</p> |
