发明名称 Semiconductor device and etching mask used for fabricating the same
摘要 A semiconductor device (Fig. 6) is provided with a device formation region (50) formed by etching using a reticle (52; Fig. 5) as an etching mask. The device formation region is shaped to have at least two curved portions having different radii (R1, R2) being encircled with an insulation layer (59), so that radiated light is not converged to a single point inside the device formation region by light reflection on the inner edge of the insulation layer. Unwanted etching away of portions of gate electrodes (56, 58) is thereby avoided. <IMAGE> <IMAGE>
申请公布号 EP0520817(B1) 申请公布日期 1997.05.21
申请号 EP19920305907 申请日期 1992.06.26
申请人 NEC CORPORATION 发明人 YAMANAKA, KOJI
分类号 H01L21/76;H01L21/027;H01L21/28;H01L21/316;H01L21/762 主分类号 H01L21/76
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