发明名称 DEVICE FOR MEASURING JUNCTION-CASE THERMAL RESISTANCE OF SEMICONDUCTOR DIODES
摘要 FIELD: diode parameter measurement technology. SUBSTANCE: device has initial current supply, heating current supply, control pulse generator inverting amplifier-limiter, heat-sensing parameter voltage detector, diode heating current and voltage detector, selective voltmeter, electronic switch, diode heating current and voltage mode switch, mode switch for measuring heat-sensing parameter voltage and heating power components, low-value current-collecting resistor, and isolating capacitor. EFFECT: reduced cost of thermal resistance measuring hardware.
申请公布号 RU94031176(A) 申请公布日期 1997.05.20
申请号 RU19940031176 申请日期 1994.08.15
申请人 UL'JANOVSKIJ GOSUDARSTVENNYJ TEKHNICHESKIJ UNIVERSITET 发明人 SERGEEV V.A.;JUDIN V.V.
分类号 G01R31/26 主分类号 G01R31/26
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