发明名称 METHOD AND EQUIPMENT FOR DETECTING DEFECT
摘要 PROBLEM TO BE SOLVED: To detect a defect quickly and surely by projecting an illumination light to a light transmitting container turning about an axis, detecting the intensity distribution in the direction perpendicular to the axis of reflected light, and then making a decision whether a defect is present based on the intensity distribution. SOLUTION: A glass bottle 11 located in an inspection area on a conveyor is turned about the axis thereof by one revolution or more in about 0.3sec. One-dimensional video cameras 14a-14c are disposed opposite to the central part of inspection area on the side of conveyor and a video signal for scanning the glass bottle 11 in the inspection area from left to right everyμsec, for example, is delivered continuously to a defect decision means 15. A light source, i.e., a reflector lamp 16, is disposed opposite to the cameras 14a-14c while interposing the glass bottle 11 in the inspection area between them such that the irradiating direction intersects the optical axis of camera 14a-14c. The means 15 includes a gate circuit and if a video signal exceeding the defect level is produced at the time of production of gate signal, a decision is made that a defect, e.g. a crack is present.
申请公布号 JPH09133640(A) 申请公布日期 1997.05.20
申请号 JP19950288943 申请日期 1995.11.07
申请人 OJI KOEI KK;IMAMURA FUJIO 发明人 HATTANDA HIROAKI;IMAMURA FUJIO
分类号 G01N21/90;(IPC1-7):G01N21/90 主分类号 G01N21/90
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