发明名称 Process for manufacturing integrated circuit with power field effect transistors
摘要 A manufacturing process for an integrated circuit which includes at least one vertical-current-flow MOS transistor. The patterned photoresist which screens the body implant is also used to mask the etching of a nitride layer over a pad oxide. After the photoresist is cleared, the nitride pattern is transferred into the oxide, and the resulting oxide/nitride stack is used to mask the source implant. The nitride/oxide stack is then removed, the gate oxide is grown, and the gate layer is then deposited.
申请公布号 US5631177(A) 申请公布日期 1997.05.20
申请号 US19950380725 申请日期 1995.01.30
申请人 SGS-THOMSON MICROELECTRONICS, S.R.L.;CONSORZIO PER LA RICERCA SULLA MICROELECTTRONICA NEL MEZZOGIORNO 发明人 ZAMBRANO, RAFFAELE
分类号 H01L21/336;H01L21/8234;H01L29/08;H01L29/423;H01L29/78;(IPC1-7):H01L21/33 主分类号 H01L21/336
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