发明名称 |
Process for manufacturing integrated circuit with power field effect transistors |
摘要 |
A manufacturing process for an integrated circuit which includes at least one vertical-current-flow MOS transistor. The patterned photoresist which screens the body implant is also used to mask the etching of a nitride layer over a pad oxide. After the photoresist is cleared, the nitride pattern is transferred into the oxide, and the resulting oxide/nitride stack is used to mask the source implant. The nitride/oxide stack is then removed, the gate oxide is grown, and the gate layer is then deposited.
|
申请公布号 |
US5631177(A) |
申请公布日期 |
1997.05.20 |
申请号 |
US19950380725 |
申请日期 |
1995.01.30 |
申请人 |
SGS-THOMSON MICROELECTRONICS, S.R.L.;CONSORZIO PER LA RICERCA SULLA MICROELECTTRONICA NEL MEZZOGIORNO |
发明人 |
ZAMBRANO, RAFFAELE |
分类号 |
H01L21/336;H01L21/8234;H01L29/08;H01L29/423;H01L29/78;(IPC1-7):H01L21/33 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|