发明名称 Digital-to-analog converter test method and apparatus
摘要 A method and apparatus for testing the linearity of a digital-to-analog converter that uses equally-weighted signal sources to convert high-order bits of digital input, and unequally-weighted signal sources to convert low-order bits. Minimum and maximum digital inputs are supplied, and a linear input-output characteristic is calculated from the two resulting analog output values. The nonlinearity error is calculated by finding the deviations from this linear input-output characteristic of two sets of analog output values: one set obtained by varying the high-order bits while holding the low-order bits constant; the other set obtained by varying the low-order bits while holding the high-order bits constant.
申请公布号 US5631649(A) 申请公布日期 1997.05.20
申请号 US19960660873 申请日期 1996.06.10
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 NAKAMURA, YASUYUKI
分类号 H03M1/10;H03M1/74;(IPC1-7):H03M1/10 主分类号 H03M1/10
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