发明名称 METHOD AND APPARATUS FOR LASER ANNEALING
摘要 PROBLEM TO BE SOLVED: To obtain a laser irradiation effect whose uniformity is high and to make the life of a laser light source long by a method wherein an energy distribution in the direction of a line width in the focus of a linear laser beam used to irradiate a semiconductor film face is specified. SOLUTION: When a face, to be irradiated, composed of a semiconductor film is irradiated with a linear laser beam which uses a pulsed laser as a light source, an energy distribution in the direction of a line width in the focus of the linear laser beam is specified. That is to say, a maximum energy is set at 1, a beam width at an energy of 0.95 is designated as L1, and a beam width at an energy of 0.70 is designated as L1+L2 (a line width on one side) + L3 (a line width on the other side). Then, expressions of inequality of 0.5 L1<=L2<=L1 and 0.5 L1<=L3<=L1 are to be satisfied. The laser beam obtained by this configuration has a depth of focus within about±400μm, and it is possible to obtain a margin of about two to eight times with reference to the undulation of a substrate or a film.
申请公布号 JPH09129573(A) 申请公布日期 1997.05.16
申请号 JP19960212060 申请日期 1996.07.22
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;KUSUMOTO NAOTO;TANAKA KOICHIRO
分类号 G02B19/00;G02B3/00;G02B3/06;H01L21/02;H01L21/20;H01L21/268;H01L21/336;H01L27/12;H01L29/786;H01S3/0979;(IPC1-7):H01L21/268;H01S3/097 主分类号 G02B19/00
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