| 摘要 |
PROBLEM TO BE SOLVED: To decrease the test man-hours of the computer system. SOLUTION: Input data of a specific field of a stored test input data pattern are set as a code pattern (step 302), one test input data pattern stored in a test pattern information file is read out, and the contents of a specific field of this one test input data pattern is replaced with one stored code pattern to automatically generate a test input data pattern (step 302). Then the automatically generated test input data pattern is inputted to the computer system to conduct a test (step 304). |
