发明名称 IC CONVEYOR, IC POSTURE CHANGER AND IC TAKEOUT APPARATUS
摘要 A semiconductor device transfer system used in a semiconductor tester of a tray-magazine type, which comprises a semiconductor device conveyor and a device for changing the attitude of devices being conveyed. The semiconductor devices are loaded into a horizontal testing tray from a magazine which is supported obliquely to feed them by gravity. The inclined semiconductor devices from the magazine are turned to be horizontal by means of a rail extending gently downward and ending in horizontal state, or a movable rail which rotates in a horizontal direction after receiving inclined semiconductor devices, or a rotary arm which holds inclined semiconductor devices and puts them in horizontal state while turning 180 DEG .
申请公布号 WO9717619(A1) 申请公布日期 1997.05.15
申请号 WO1995JP02393 申请日期 1995.11.24
申请人 ADVANTEST CORPORATION;WATANABE, YUTAKA;OKUDA, HIROSHI;YAMASHITA, KAZUYUKI;SAGAWA, MAKOTO;NAKAJIMA, HARUKI;KAWANO, SHIGENORI 发明人 WATANABE, YUTAKA;OKUDA, HIROSHI;YAMASHITA, KAZUYUKI;SAGAWA, MAKOTO;NAKAJIMA, HARUKI;KAWANO, SHIGENORI
分类号 G01R31/01;G01R31/26;G01R31/28;G01R31/319;H01L21/68;H05K13/02;(IPC1-7):G01R31/26 主分类号 G01R31/01
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