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发明名称
Testing device for integrated circuits
摘要
申请公布号
EP0496207(B1)
申请公布日期
1997.05.14
申请号
EP19920100192
申请日期
1992.01.08
申请人
EHLERMANN, ECKHARD, DR.
发明人
EHLERMANN, ECKHARD, DR.
分类号
G01R1/073;(IPC1-7):G01R1/073
主分类号
G01R1/073
代理机构
代理人
主权项
地址
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