发明名称 Method and apparatus for interim in-situ testing of an electronic system with an inchoate ASIC
摘要 A technique is described for testing the performance of a target electronic system ultimately employing an ASIC comprising a core cell and surrounding logic, using an inchoate (designed, but not yet fabricated) ASIC on an interim basis. In one embodiment, a Q-part, or qualification part, which is essentially a bond-out of the core cell, is used in conjunction with programmable logic devices configured to perform the function of the surrounding logic. The Q-part and programmable logic are interconnected on a pod, and plugged into an interim version of a target electronic system. In another embodiment, the Q-part is software-simulated and interconnected on the pod to programmable logic devices. The programmable logic devices may be programmed either on-pod or off-pod, and signals incident to the operation of the pod plugged into the interim electronic system can be monitored and controlled.
申请公布号 US5629876(A) 申请公布日期 1997.05.13
申请号 US19920937643 申请日期 1992.08.31
申请人 LSI LOGIC CORPORATION 发明人 HUANG, JEN-HSUN;ROSTOKER, MICHAEL D.;GLUSS, DAVID
分类号 G06F11/26;G06F17/50;(IPC1-7):G06G7/62 主分类号 G06F11/26
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