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发明名称
Verfahren zum direkten Erhalten von Amplituden und Phaseninformation eines Objekts mittels Bilder aus einem Hochauflösungs- Elektronenmikroskop
摘要
申请公布号
DE69125435(D1)
申请公布日期
1997.05.07
申请号
DE19916025435
申请日期
1991.08.06
申请人
PHILIPS ELECTRONICS N.V., EINDHOVEN, NL
发明人
VAN DIJCK, DIRK ERNEST MARIA, NL-5656 AA EINDHOVEN, NL
分类号
H01J37/22;H01J37/26;(IPC1-7):H01J37/22
主分类号
H01J37/22
代理机构
代理人
主权项
地址
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