| 摘要 |
The present invention has a purpose to provide method of measuring the inclination of an IC in order to correct its position quickly and precisely without binzarized images. The method according to this invention: 1) defines an inspection area including open ends of IC pins, 2) extracts longitudinal edges and open ends of pin of each IC pin from a density projection of each inspection area, 3) selects a representative point for each inspection area on a line along the open ends of the pins and calculates a center and inclination of an IC according to a difference of coordinates of representative points on opposite sides of the IC.
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