发明名称 POLISHING DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent contamination caused by grinding liquid in a previous stage so as to prevent a reduction in quality or yield by providing a cleaner for cleaning a material ground in a grinding unit being removed from a top ring. SOLUTION: In the case of two-stage grinding, three cleaners are operated. The flow of a semiconductor wafer is a cassette 1a → a turn-over device 5 →a first grinding unit 1a → a cleaner 7a → a second grinding unit 1b → a cleaner 7b → turn-over device 6 → a cleaner 8b → a cassette 2a. A pusher 12 receives the semiconductor wafer from a robot 4b, raises when a top ring comes to an upper part and transfers the semiconductor wafer. The semiconductor wafer after grinding is rinsed and cleaned by a rinse liquid supply device.
申请公布号 JPH09117857(A) 申请公布日期 1997.05.06
申请号 JP19960238505 申请日期 1996.08.21
申请人 EBARA CORP 发明人 TOGAWA TETSUJI;SAKURAI KUNIHIKO;KIKUTA RITSUO
分类号 H01L21/304;B24B37/04 主分类号 H01L21/304
代理机构 代理人
主权项
地址