发明名称 |
III GROUP NITRIDE SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACTURING |
摘要 |
PROBLEM TO BE SOLVED: To provide a III group nitride substrate of which coefficient of thermal expansion is near to that of a III group nitride crystal and which has an excellent crystalline surface to enable the structure of an excellent and thick element layer with less dislocations and the method of manufacturing. SOLUTION: This substrate comprises a polycrystalline III group nitride layer and a monocrystalline nitride formed on it. The monocrystalline III group nitride is grown on a monocrystalline substrate that is soluble in an acid or an alkaline solution and ten the polycrystalline III group nitride is grown. The III group nitride semiconductor substrate is manufactured by growing the monocrystalline III group nitride layer on the monocrystal surface of the nitride substrate after removing the monocrystalline substrate, that is soluble in the acid or the alkaline solution, by the acid or the alkaline solution selectively from group III nitride. |
申请公布号 |
JPH09115832(A) |
申请公布日期 |
1997.05.02 |
申请号 |
JP19950293528 |
申请日期 |
1995.10.16 |
申请人 |
NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
NAKAHIRA ATSUSHI;TANAKA HIDENAO |
分类号 |
H01L29/205;H01L21/20;H01L21/203;H01L33/16;H01L33/32 |
主分类号 |
H01L29/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|