发明名称 TWO-DIMENSIONAL POSITION AND ATTITUDE MEASURING MARK, AND METHOD AND DEVICE FOR TWO-DIMENSIONAL POSITION AND ATTITUDE MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To measure two-dimensional position and attitude with specified accuracy, by using at least two one-dimensional sensors. SOLUTION: A mark 3 having two straight lines L1 and L2 which is not parallel to each other is provided on an object surface 2 of a test object 1, and the mark 3 is imaged on at least two one-dimensional photosensors 6a and 6b. When the one-dimensional photosensors 6a and 6b output the sensor signals having light intensity distribution in the longitudinal direction, a calculation unit 9 calculates the positions of straight lines L'1 and L'2 of a mark image 3' from the sensor signals. From the calculation result, the position of an intersection P of the two straight lines L1 and L2 and the inclination of one of the two straight lines L1 and L2 are calculated. For example, the calculation results are made a reference point for position measurement and a reference line for attitude measurement, in the test object 1.
申请公布号 JPH09113222(A) 申请公布日期 1997.05.02
申请号 JP19950268901 申请日期 1995.10.17
申请人 FUJI XEROX CO LTD 发明人 TSUKAMOTO KAZUYUKI
分类号 G01B11/00;B25J13/08;G01B11/26;G06T1/00;G06T7/00 主分类号 G01B11/00
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