发明名称 POLISHING TOOL AND POLISHING METHOD AND APPARATUS USING THIS TOOL
摘要 PROBLEM TO BE SOLVED: To provide a polishing work technology whereby a rugged part of a semiconductor wafer can be made flat, using a polishing pad contacted with the entire uneven part of the wafer due to its intrinsic warp, etc., and the load on the wafer can uniformly be controlled. SOLUTION: Polishing pads 2 made of a hard material, smaller than the area of a semiconductor wafer, are used. A polishing tool 1 is composed of the pads 2 fixed to their respective support members 4 formed to fit to thereto through layers. Loading means 6 and 7 are provided respectively for the pads 2 to control so that the load on the wafer from the tool 1 may be uniform during polishing of the wafer, using the tool 1.
申请公布号 JPH09115862(A) 申请公布日期 1997.05.02
申请号 JP19950272324 申请日期 1995.10.20
申请人 HITACHI LTD 发明人 MATSUBARA SUNAO;KAWAI AKINARI
分类号 B24B37/20;B24B37/22;B24B37/24;B24B37/26;H01L21/304 主分类号 B24B37/20
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