| 摘要 |
An apparatus for testing electro-mechanical storage devices, such as disk drives, is provided. A testing device (14) in a digital computer (10) selects test parameters from an array of test parameters stored in the digital computer (10). A random number generator is used in the selection of the test parameters. When errors occur, the array of test parameters is dynamically adapted during testing to change the probability of selecting certain test parameters in response to the error. |
