首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Leuchte
摘要
申请公布号
DE4233930(C2)
申请公布日期
1997.04.30
申请号
DE19924233930
申请日期
1992.10.09
申请人
SCHEWE, JUERGEN, 69118 HEIDELBERG, DE
发明人
SCHEWE, JUERGEN, 69118 HEIDELBERG, DE
分类号
F21S8/02;F21V7/00;F21V7/22;F21V17/02;F21V17/04;F21V17/16;(IPC1-7):F21S1/02;F21V7/04;F21V7/09;F21V13/04;F21V17/00
主分类号
F21S8/02
代理机构
代理人
主权项
地址
您可能感兴趣的专利
NON-VOLATILE DISPLAY ACCESSORY CONTROLLED AND POWERED BY A MOBILE DEVICE
SYSTEM AND METHOD FOR CONTROLLING AN EVENT IN A VIRTUAL REALITY ENVIRONMENT BASED ON THE BODY STATE OF A USER
MULTI-LOOP ANTENNA SYSTEM FOR CONTACTLESS APPLICATIONS
SUBSURFACE ANTENNA FOR RADIO FREQUENCY HEATING
HYBRID RADIO FREQUENCY / INDUCTIVE LOOP ANTENNA
ENHANCED HIGH EFFICIENCY 3G/4G/LTE ANTENNAS, DEVICES AND ASSOCIATED PROCESSES
Antenna System Having Two Antennas and Three Ports
ELECTRONICALLY STEERABLE PLANAR PHASE ARRAY ANTENNA
OBJECT ORIENTATION TRACKER
CRANE BOOM POINTING ANGLE DETERMINATION
DUMP TRUCK WITH OBSTACLE DETECTION MECHANISM AND METHOD FOR DETECTING OBSTACLE
System and Method for Doppler Radar Monitoring of Restricted Areas Below Bucket Trucks, Lineworkers on Power Distribution Poles or Other Elevated Loads
APPARATUS AND METHOD FOR OPTIMIZING DATA CAPTURE AND DATA CORRECTION FOR SPECTROSCOPIC ANALYSIS
OPTICAL EMISSION SPECTROSCOPIC (OES) INSTRUMENT WITH AUTOMATIC TOP AND BOTTOM SLIT CURTAINS
POSITIONING MEANS FOR A MEASURING CELL
SYSTEM AND METHOD TO DETERMINE DEPTH FOR OPTICAL WAFER INSPECTION
SINGLE-FIBER NONCRITICAL-ALIGNMENT WAFER-SCALE OPTICAL TESTING
MEASURING BRILLOUIN BACKSCATTER FROM AN OPTICAL FIBRE USING DIGITISATION
OPTICAL DEFECT INSPECTION SYSTEM
SYSTEM AND METHOD FOR SAFER DETECTION OF UNKNOWN MATERIALS USING DUAL POLARIZED HYPERSPECTRAL IMAGING AND RAMAN SPECTROSCOPY