发明名称 FORMING METHOD OF CONDUCTIVE LAYER IN SEMICONDUCTOR DEVICE
摘要 A method for forming a conductive layer having a good profile using TEOS layer having low reflectance index is disclosed. On a conductive layer(3) such as WSi, TEOS layer(4) having low reflectance index and high etching rate is deposited. Using a first photoresist pattern(5A) defined peripheral circuit region and a second photoresist pattern(5B) defined cell regions as a mask, the exposed TEOS layer(4) is firstly etched. Then, the exposed conductive layer is secondly etched using the remained TEOS layer(4) and the photoresist patterns(5A)(5B) as a mask. By using the TEOS layer having high etch rate and low reflectance index as a hard mask, it is possible to easily make the conductive layer having a stable profile.
申请公布号 KR970006933(B1) 申请公布日期 1997.04.30
申请号 KR19940012274 申请日期 1994.06.01
申请人 HYUNDAI ELECTRONICS IND.CO. 发明人 JUNG, JONG-HO;JUNG, JONG-MOON;JUNG, KI-CHOL
分类号 H01L21/3205;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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