发明名称 |
FORMING METHOD OF CONDUCTIVE LAYER IN SEMICONDUCTOR DEVICE |
摘要 |
A method for forming a conductive layer having a good profile using TEOS layer having low reflectance index is disclosed. On a conductive layer(3) such as WSi, TEOS layer(4) having low reflectance index and high etching rate is deposited. Using a first photoresist pattern(5A) defined peripheral circuit region and a second photoresist pattern(5B) defined cell regions as a mask, the exposed TEOS layer(4) is firstly etched. Then, the exposed conductive layer is secondly etched using the remained TEOS layer(4) and the photoresist patterns(5A)(5B) as a mask. By using the TEOS layer having high etch rate and low reflectance index as a hard mask, it is possible to easily make the conductive layer having a stable profile.
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申请公布号 |
KR970006933(B1) |
申请公布日期 |
1997.04.30 |
申请号 |
KR19940012274 |
申请日期 |
1994.06.01 |
申请人 |
HYUNDAI ELECTRONICS IND.CO. |
发明人 |
JUNG, JONG-HO;JUNG, JONG-MOON;JUNG, KI-CHOL |
分类号 |
H01L21/3205;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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