发明名称 Bipolar transistor circuit capable of high precision measurement of current amplification factor
摘要 In a semiconductor device, a first resistor is connected between the base and collector of a dummy bipolar transisitor, a second resistor is connected between the base and emitter of the dummy bipolar transistor, and a third resistor is connected to the collector of the dummy bipolar transistor. A first pad and a second pad are connected to the base and emitter, respectively, of the dummy bipolar transistor. A third pad is connected to the third resistor. A fourth pad is connected to the collector of the dummy bipolar transistor.
申请公布号 US5625295(A) 申请公布日期 1997.04.29
申请号 US19940350062 申请日期 1994.11.29
申请人 NEC CORPORATION 发明人 KURISU, MASAKAZU
分类号 G01R31/26;G01R31/27;G01R31/28;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):G01R27/26 主分类号 G01R31/26
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