发明名称 An apparatus for controlling a charged particle beam and a lithographic process in which the apparatus is used
摘要 <p>The invention is directed to an apparatus and process in which a particle beam is used to introduce a pattern into an energy sensitive material. A coil assembly is used to selectively control both the orientation of the particle beam relative to the substrate on which the energy sensitive material is applied and the magnification or demagnification of the image in the particle beam. The coil assembly comprises at least two coils. The particle beam (15) is projected through the coil assembly (60). In one embodiment, the coil assembly is used to rotate the particle beam to compensate for an observed difference between the actual substrate orientation and the desired substrate orientation. The coils in the coil assembly are excited so that the desired rotation is introduced into the particle beam by the cumulative effects of the magnetic fields generated by the excited coils in the coil assembly. The coils in the coil assembly are calibrated such that the desired amount of beam rotation is provided by the coil assembly without introducing unwanted lens effects into the beam. However, the coil assembly can be calibrated to introduce desired lens effects into the beam as well as the desired rotation. In another embodiment, the coils are used to introduce a desired lens effect, such as magnification or demagnification, into the particle beam without introducing unwanted rotation into the beam.</p>
申请公布号 EP0769800(A2) 申请公布日期 1997.04.23
申请号 EP19960307340 申请日期 1996.10.09
申请人 AT&T CORP. 发明人 WASKIEWICZ, WARREN KAZMIR
分类号 G03F7/20;H01J37/30;H01J37/304;H01J37/305;H01J37/317;H01L21/027;(IPC1-7):H01J37/317 主分类号 G03F7/20
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