发明名称 DIELECTRIC MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To make a specific dielectric constant maximum, by using a dielectric thin film with a ferroelectric phase transition point on a give temperature range. SOLUTION: A capacitor part made up of a dielectric film selected by a cell-selecting transistor part, and upper and lower electrodes with the dielectric film in between. A voltage through a wire 10 is applied to the electrodes of the capacitor part to accumulate charge. The function of memory cell is carried out by using a change in the accumulating and discharging step with the wire 10. A specific dielectric constant of oxide dielectric material depends greatly on temperatures, especially in a material with property of ferroelectric phase transition, the specific dielectric constant becomes a maximum at a temperature of phase transition and becomes smaller by about one place at temperatures other than the vicinity temperature at the phase transfer. There are few dielectric material with a single body having a maximum specific dielectric constant at temperatures from 0 to 80 deg.C. In this case, a dielectric material made of BTS15 is used, and thereby a cell area becomes smaller than one sixth of a conventional one.
申请公布号 JPH09107079(A) 申请公布日期 1997.04.22
申请号 JP19950264118 申请日期 1995.10.12
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 TSUKADA MITSUO;MUKODA MASASHI;MIYAZAWA SHINTARO
分类号 H01L21/8247;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/105;H01L27/108;H01L29/788;H01L29/792 主分类号 H01L21/8247
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