发明名称 Method for reclaiming substrate from semiconductor wafers
摘要 A method of reclaiming a substrate wafer and a reclaimed substrate wafer. A semiconductor wafer having external layers from previous processing is reclaimed by etching the external layers and cup-wheel grinding an active surface of the wafer to remove semiconductor components such as diffused regions. Either the active surface or the backside of the wafer is then polished to a mirror finish to provide a highly crystalline surface. The cup-wheel grinding produces a pinwheel surface roughness pattern and is accomplished by grinding the wafer with a cup-shaped grinding wheel having an axis of rotation parallel to but offset from an axis of rotation of the wafer. Preferably, the rim of the cup-shaped grinding wheel always passes over the axis of rotation of the wafer.
申请公布号 US5622875(A) 申请公布日期 1997.04.22
申请号 US19940291073 申请日期 1994.08.17
申请人 KOBE PRECISION, INC. 发明人 LAWRENCE, JOHN E.
分类号 B24B7/22;H01L21/02;H01L21/302;(IPC1-7):H01L21/304 主分类号 B24B7/22
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