发明名称 A mos transistor having a composite gate electrode and method of fabrication
摘要 A novel, reliable, high performance MOS transistor with a composite gate electrode which is compatible with standard CMOS fabrication processes. The composite gate electrode comprises a polysilicon layer formed on a highly conductive layer. The composite gate electrode is formed on a gate insulating layer which is formed on a silicon substrate. A pair of source/drain regions are formed in the substrate and are self-aligned to the outside edges of the composite gate electrode.
申请公布号 HK43297(A) 申请公布日期 1997.04.18
申请号 HK19970000432 申请日期 1997.04.10
申请人 INTEL CORPORATION 发明人 ROBERT S CHAU;DAVID B FRASER;KENNETH C CADIEN;GOPAL RAGHAVAN;LEOPOLDO D YAU
分类号 H01L29/43;H01L21/28;H01L21/336;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L29/78;H01L29/40 主分类号 H01L29/43
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