发明名称 |
SOI-MOS transistor structure |
摘要 |
The transistor has a pair of n+ source/drain regions (3a,3b,3c) and a p+ channel potential fixing region (4a,4b). An active region (5) is sub-divided by first, second, third and fifth wires (1,2,14,15). When holes stored in an effective channel region (11) flow into the channel potential fixing region the substrate suspension effect can then be prevented. When the width of one region of the pair of source/drain regions is wider than the other region the contact resistance can be reduced.
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申请公布号 |
DE19623846(A1) |
申请公布日期 |
1997.04.17 |
申请号 |
DE19961023846 |
申请日期 |
1996.06.14 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP |
发明人 |
EIMORI, TAKAHISA, TOKIO/TOKYO, JP;OASHI, TOSHIYUKI, TOKIO/TOKYO, JP;SHIMOMURA, KENICHI, TOKIO/TOKYO, JP |
分类号 |
H01L21/762;H01L21/76;H01L21/822;H01L27/04;H01L27/12;H01L29/423;H01L29/786;(IPC1-7):H01L29/772;H01L29/94 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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