发明名称 Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test
摘要 An improved output driver circuit for a semiconductor integrated circuit device is provided. The output driver circuit receives a type select signal ( phi 1, / phi 1) determined by bonding selection. When a heavy load circuit is connected to an output terminal (DQ), a signal ( phi 1) of low level and a signal (/ phi 1) of high level are provided, whereby transistors (18, 19) are turned on simultaneously in response to a data signal (Mo). When a light load circuit is connected to the terminal (DQ), a signal ( phi 1) of high level and a signal (/ phi 1) of low level are provided, whereby transistors (18, 19) are turned on at a different timing. More specifically, following charging of a light load by a transistor (18) having low mutual conductance, a transistor (19) is turned on. Therefore, noise generation can be flexibly suppressed by bonding selection.
申请公布号 US5621348(A) 申请公布日期 1997.04.15
申请号 US19950447587 申请日期 1995.05.23
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 FURUTANI, KIYOHIRO;OZAKI, HIDEYUKI
分类号 G01R31/28;G11C7/10;G11C29/50;H03G11/04;H03K5/01;H03K5/13;H03K19/003;H03K19/0185;(IPC1-7):G05F1/10 主分类号 G01R31/28
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