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发明名称
PROBE CARD AND METHOD FOR INSPECTING SEMICONDUCTOR INTEGRATED CIRCUIT USING PROBE CARD
摘要
申请公布号
JPH09102520(A)
申请公布日期
1997.04.15
申请号
JP19950257464
申请日期
1995.10.04
申请人
HITACHI LTD
发明人
FUKAZAWA HIROSHI
分类号
G01R31/26;G01R1/073;H01L21/66;(IPC1-7):H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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