| 摘要 |
<p>A test socket (11) for an IC device (13) has relatively thin contact interface wall (20) having an array of double-ended pogo pins (29). The double-ended pogo pins (29) provide resilient spring-loaded contacts for the I/O contacts (30) of an IC device (13) held in the socket as well as for the circuit contacts (32) of a PC board (15) to which the socket is mounted.</p> |
