APPARATUS FOR SIMULTANEOUS X-RAY DIFFRACTION AND X-RAY FLUORESCENCE MEASUREMENTS

摘要

In the case of simultaneous diffraction and fluorescence measurements in an apparatus for X-ray analysis comprising only one X-ray tube, a problem is encountered in that due to the presence of the collimators required for the fluorescence measurements only a very low X-ray power reaches the detectors, so that very long measuring times and/or an unfavorable signal-to-noise ratio occur. As a result, the detection limit for given measurements (low concentration of an element and/or light element to be detected) becomes too high or the use of a (large and expensive) high-power X-ray tube is required. The invention utilizes a line focus tube (10) in combination with a single-slit collimator (14) for irradiating the sample (2), the fluorescence section (40) being constructed so as to have a plane or cylindrical analysis crystal (42) in combination with a location-sensitive detector (44). The diffraction measurements are performed by means of a conventional diffraction arrangement (24).