发明名称 X-ray examination apparatus
摘要 <p>A contour is determined in the X-ray image by means of an image processing unit (13) in an X-ray examination apparatus (2,5) so that arithmetic means (16) can determine the position of absorbing diaphragm slats (24,25;26,27) which enclose a minimum area situated around the contour. The diaphragm slats are moved to the correct position by way of a drive unit (17). As a result, overexposure of the X-ray image intensifier tube (5) is counteracted and the medical details in the image become more distinct. Image harmonization can be realised by using X-ray absorbing wedges (43-46), arrangement of the wedges in excessively light parts of the X-ray image enables the dynamic range to be increased at areas of interest. The position of the wedges is calculated on the basis of a dose calculation based on an exposure time and the voltage and current applied to the X-ray source (2), said quantities being applied to the arithmetic means via a control unit (15). &lt;IMAGE&gt;</p>
申请公布号 EP0496438(B1) 申请公布日期 1997.04.09
申请号 EP19920200007 申请日期 1992.01.03
申请人 PHILIPS ELECTRONICS N.V. 发明人 STEGEHUIS, HERMAN
分类号 A61B6/06;(IPC1-7):A61B6/06;A61B6/03 主分类号 A61B6/06
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