| 摘要 |
A method is disclosed for characterizing the subsurface levels of the Earth with a greater degree of accuracy than hitherto. Seismic data samples are migrated and stacked, for example according to known techniques and then spectrum analyzed. The spectrum analysis is applied to a feature of the subsurface and, for example, a particular layer bounded by a pair of horizons would be subject to volume reflection spectral analysis. The analysis is carried out using an orthogonal base by defining the reflection signals in terms of coefficients to a set of orthogonal polynomials. Additional seismic characteristics or attributes may be directly calculated from the polynomial coefficients. These coefficients represent the characteristics of the layer to a high degree of accuracy and may be compared with spectra derived a priori (for example, synthetic spectra or previously characterized spectra) to further assist in analysis of measured seismic data. |
