发明名称
摘要 Titianium nitride film is deposited upon a semi-conductor substrate by chemical vapor deposition of titanium tetrachloride, ammonia and a diluent at temperatures less than 550 DEG C. This is accomplished by minimizing the boundary layer thickness over the substrate.
申请公布号 JPH09503623(A) 申请公布日期 1997.04.08
申请号 JP19950510790 申请日期 1994.03.25
申请人 发明人
分类号 C23C16/34;C23C16/44;C23C16/455;C23C16/458;H01L21/28;H01L21/285;(IPC1-7):H01L21/285 主分类号 C23C16/34
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