| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC test equipment which performs the test in a short time with a simple hardware constitution. SOLUTION: A detection circuit 13 which detects inversion of the output state of an output (b) to be tested of an IC 11 to be tested, a comparison circuit 15, and a judging circuit 16 which judges whether the IC 11 to be tested is good or not based on comparison results of the comparison circuit 15 are provided. The output state of the output (b) to be tested and an output state (d) of the detection circuit 13 at the time of input of clocks (a), whose number is smaller than the number of clocks required for inversion of the output state of the output (b) to be tested of the IC 11 to be tested by one, are compared with a value preliminarily set in a storage circuit 14 by the comparison circuit 15, and those values at the time of input of clocks whose number is equal to the number of clocks required for inversion of the output (b) to be tested of the IC 11 to be tested are compared with the value preliminarily set in the storage circuit 14 by the comparison circuit 15. |
