| 摘要 |
PROBLEM TO BE SOLVED: To obtain a test pattern generation system in which the logical state can be set at a plurality of points in a logic circuit by inserting a circuit, producing a specified output when a plurality of nodes are in specified logic states, additionally into the logic circuit. SOLUTION: An input section 101 inputs a circuit data, a plurality of nodes to be controlled, and the circuit information, e.g. the logical state at each node, to a pseudo circuit generating section 140 and the information is read in at a read-in section 141. The node to be branched is then extracted from the circuit information and a circuit, producing a specified output when a plurality of nodes take specified logic states, is inserted additionally into the logic circuit. The additional circuit is a single output element having a plurality of nodes to be controlled simultaneously as the inputs and the output thereof is led out to an external output terminal. When a plurality of nodes are collected at one output (node), a test pattern can be generated for a single node. When the output from the inserted element is led out to an external terminal, useless signal propagation path can be eliminated. |
