发明名称 ACTIVE MATRIX SUBSTRATE AND METHOD FOR TESTING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide an active matrix substrate capable of preventing a destroy of an insulation film even after testing; and a method for testing the substrate. SOLUTION: A short-circuit member 11 between a gate line block 13 and a source line block 14 has in parallel a first portion 111 which is in from a short-circuit state to an insulation state by laser irradiation in between both blocks; and a second portion 112 which is in from an insulation portion to a short-circuit portion by laser irradiation.</p>
申请公布号 JPH0997910(A) 申请公布日期 1997.04.08
申请号 JP19950343077 申请日期 1995.12.28
申请人 SHARP CORP 发明人 KURIHARA SUNAO
分类号 H01L29/786;G02F1/1368;H01L21/66;H01L27/12;(IPC1-7):H01L29/786 主分类号 H01L29/786
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