发明名称 |
ACTIVE MATRIX SUBSTRATE AND METHOD FOR TESTING THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide an active matrix substrate capable of preventing a destroy of an insulation film even after testing; and a method for testing the substrate. SOLUTION: A short-circuit member 11 between a gate line block 13 and a source line block 14 has in parallel a first portion 111 which is in from a short-circuit state to an insulation state by laser irradiation in between both blocks; and a second portion 112 which is in from an insulation portion to a short-circuit portion by laser irradiation.</p> |
申请公布号 |
JPH0997910(A) |
申请公布日期 |
1997.04.08 |
申请号 |
JP19950343077 |
申请日期 |
1995.12.28 |
申请人 |
SHARP CORP |
发明人 |
KURIHARA SUNAO |
分类号 |
H01L29/786;G02F1/1368;H01L21/66;H01L27/12;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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