发明名称 Fuse redundancy circuitry for a semiconductor memory device
摘要 A programming section of a semiconductor memory device includes an external power source detecting circuit adapted for detecting an initial power supply and for generating a power-up signal, a gate control section for receiving the power-up signal from the external power source detecting circuit and for generating a first signal and a second signal, a programmable ROM cell for receiving the first and second signals from the gate control section and for generating an output, and a latch section for latching the output of the programmable ROM cell.
申请公布号 US5619469(A) 申请公布日期 1997.04.08
申请号 US19950569795 申请日期 1995.12.06
申请人 LG SEMICON CO., LTD. 发明人 JOO, YANG-SUNG
分类号 G11C17/14;G11C17/00;G11C17/18;G11C29/00;G11C29/04;(IPC1-7):G11C7/00 主分类号 G11C17/14
代理机构 代理人
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