发明名称 |
Non-contact precision measurement system |
摘要 |
The invention is a non-contact precision measurement system and a method of measuring using the system. The surface contour of an object is measured,utilizing non-contact components, such as lasers. A measurement unit traverses a linear positioner which is parallel to the object to be measured. Then deviations are measured from a baseline reference to determine any deviations in the positioner. The measurement unit also measures the distance between the positioner and the object to produce a distance profile which is adjusted in accordance with the deviations to determine a true surface profile. This system can also be used to measure both an upper and lower surface profile to determine a thickness or to align a plurality of objects in parallel.
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申请公布号 |
US5617645(A) |
申请公布日期 |
1997.04.08 |
申请号 |
US19950432630 |
申请日期 |
1995.05.02 |
申请人 |
WICK, WILLIAM R. W. |
发明人 |
WICK, WILLIAM R. W.;WOOD, PAMELA G. |
分类号 |
G01B11/24;G01B11/27;G01B11/30;(IPC1-7):G01B11/24 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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