发明名称 Non-contact precision measurement system
摘要 The invention is a non-contact precision measurement system and a method of measuring using the system. The surface contour of an object is measured,utilizing non-contact components, such as lasers. A measurement unit traverses a linear positioner which is parallel to the object to be measured. Then deviations are measured from a baseline reference to determine any deviations in the positioner. The measurement unit also measures the distance between the positioner and the object to produce a distance profile which is adjusted in accordance with the deviations to determine a true surface profile. This system can also be used to measure both an upper and lower surface profile to determine a thickness or to align a plurality of objects in parallel.
申请公布号 US5617645(A) 申请公布日期 1997.04.08
申请号 US19950432630 申请日期 1995.05.02
申请人 WICK, WILLIAM R. W. 发明人 WICK, WILLIAM R. W.;WOOD, PAMELA G.
分类号 G01B11/24;G01B11/27;G01B11/30;(IPC1-7):G01B11/24 主分类号 G01B11/24
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