| 摘要 |
PROBLEM TO BE SOLVED: To provide the fine-grain sampling plate for heavy metal for sampling the attached heavy-metal fine grains, which are not observed with eyes, and the fine-grain analysis method for the heavy metal. SOLUTION: The external shape of a fine-grain sampling plate 100 for heavy metal is made to be the optimal size, which can be provided at the sample providing places of the various kinds of analyzers. The plate is provided in the external shape so that the plate is adapted to the sample attaching stages of the sample holders of various kinds of the analyzers. The fine-grain sampling plate 100 for the heavy metal and the heavy-metal fine grains to be sampled do not form the stable molecule bonding. But a smooth alumina substrate 102 or a glass substrate is made to be the base, and an Au film 101 having the thickness where interference fringes are not formed at the time of FTIR analysis is finished to the mirror surface by a sputtering method on the base so as to provide the function of the physical attracting force that is Van del Waals force. As the fine-grain analysis method for the heavy metal, the grains are contained into the individual housing case for preventing the attachment of the heavy-metal fine grains at the place other than the objective place, and the grains are sampled and contained into the individual containing case. |
