发明名称 FERROELECTRIC MEMORY AND READING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To prevent erroneous inversion of data by applying a read voltage within such range as causing no inversion of polarization in a ferroelectric film. SOLUTION: A gate insulation film 21, a lower electrode 31, a ferroelectric film 22 and an upper electrode 32 are formed sequentially on a substrate 10. When a data is read out from such ferroelectric memory, a read voltage VR is applied between the upper electrode 32 and a drain 12 utilizing the residual polarizaiton of ferroelectric film 22 and '1' or '0' is determined depending on the fact whether a current flows between the source 11 and the drain 12 or not. In this regard, the read voltage VR is applied within such range as causing no inversion of polarization in the ferroelectric film. For example, 0V is applied to the gate 31, source 11 and substrate 10 and a voltage VR, satisfying a formula|VR|< (CF+Co)/Co}.|Vc|, is applied to the drain 12. In the formula, CF is the capacitance (fF) of ferroelectric film 22, Co is the capacitance (fF) between the lower electrode 31 and the drain 12, and Vc is the coercive voltage (V) of ferroelectric film 22.
申请公布号 JPH0992735(A) 申请公布日期 1997.04.04
申请号 JP19950247655 申请日期 1995.09.26
申请人 SONY CORP 发明人 EMORI TAKAYUKI
分类号 G11C17/00;G11C11/22;G11C16/02;G11C16/04;H01L21/8246;H01L21/8247;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 G11C17/00
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