发明名称 SEMICONDUCTOR PACKAGE SUBSTRATE, AND DETECTION METHOD AND DEVICE FOR IT
摘要 PROBLEM TO BE SOLVED: To make a wiring pattern into higher density and to improve strength of a connection pad layer by forming at least one photo-via, connecting a connection pad with an inner layer pattern on a substrate, in the connection pad. SOLUTION: A connection pad 2 directly or indirectly connected to a connectiointerminal of a mother board, and an inner layer pattern 3 connected to the connection pad 2, are provided. In such a semiconductor package substrate 1, at least one photo-via 4, connecting the connection pad 2 with the inner layer pattern 3, is provided in the connection pad 2. For example, a single photo-via 4 is formed on the central position of an LGA pad 2, and the inner pattern 3 and the LGA pad 2 are connected to each other through the photo-via 4. The LGA pad 2 is formed into circle whose diameter A is 600μm, and the photo-via 4 is formed into circle whose diameter B is 150μm.
申请公布号 JPH0992754(A) 申请公布日期 1997.04.04
申请号 JP19950269131 申请日期 1995.09.21
申请人 IBIDEN CO LTD 发明人 YAMADA KAZUHITO;KAWAMURA YOICHIRO
分类号 G01R31/26;H01L23/12;H05K3/46;(IPC1-7):H01L23/12 主分类号 G01R31/26
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