发明名称 TEST METHOD FOR EXPOSURE TO HIGH-TEMPERATURE GAS
摘要 PROBLEM TO BE SOLVED: To obtain a test method in which many test pieces can be set for one test by a method wherein a plurality of pillar-shaped test pieces are arranged in such a way that they are at right angles to the flow direction of a gas inside a cylindrical support tube and that they are spiral in the flow direction of the gas. SOLUTION: A plurality of testing jigs 5 are stacked. At this time, a plurality of test pieces 1 are installed by changing an angleθgradually with reference to their stacking direction, and the test pieces 1 are arranged to be a spiral shape with reference to their tacking direction. In addition, the distance in the stacking direction between every test piece 1 and every test piece 1 becomes a thickness nearly equal to that of ring-shaped support members 2, 2'. The distance is arranged in such a way that it does not obstruct the flow of a high- temperature gas. When the high-temperature gas is made to flow into a cylindrical support tube 6 formed by a stacked body of the memebers 2, 2' in which the plurality of test pieces 1 are installed, the test pieces 1 which are arranged inside the support tube can be exposed to the high-temperature gas under the same condition. After that, the support tube 6 is dismantled, and the test pieces are taken out.
申请公布号 JPH0989756(A) 申请公布日期 1997.04.04
申请号 JP19950250736 申请日期 1995.09.28
申请人 KYOCERA CORP 发明人 ONO TAKASHI
分类号 G01N17/00;G01N1/28;(IPC1-7):G01N17/00 主分类号 G01N17/00
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