| 摘要 |
<p>The test adapter (1) proposed is intended for testing circuit boards (2). It has a transposition device (3) with contact modules (6) which have test-field-specific contacts on one side and test-specimen-specific contacts on the other side, associated contacts being connected with each other electrically. This has the considrerable advantage that contact modules with standardized contact patterns matching particular components can also be used for circuit boards with other overall configurations. The contact surfaces (8, 9) of the modules (6) can be moved relative to each other, and located on each of the contact faces are means for positioning the contact surface both relative to the test specimen (2) and relative to the transposition-device contact board (4). This enable various fine-positioning adjustments to be carried out in several areas at the same time.</p> |
