Arrangement of partially structured flat signal markers for calibration and orientation of three=dimensional sensors

摘要

The arrangement has flat signal markers mounted on several adjacent, mutually relatively inclined surfaces so that at least one signal marker can be observed approximately perpendicularly or at a steep angle from any direction. The signal markers can be mounted on the surfaces of a regular polyhedron. The angle between adjacent surfaces is selected so that the light radiation regions of the signal markers overlap each other. The signal markers are made of light scattering or retroreflective material, or each can have its own light source.