发明名称 High speed bipolar transistor using a patterned etch stop and diffusion source
摘要 A bipolar transistor (100) and a method for forming the same. A base-link diffusion source layer (118) is formed over a portion of the collector region (102). The base-link diffusion source layer (118) comprises a material that is capable of being used as a dopant source and is capable of being etched selectively with respect to silicon. A base electrode (114) is formed over at least one end portion of the base-link diffusion source layer (118) and the exposed portions of the base-link diffusion source layer (118) are removed. An extrinsic base region (110) is diffused from the base electrode (114) and a base link-up region (112) is diffused from the base-link diffusion source layer (118). Processing may then continue to form an intrinsic base region (108), emitter region (126), and emitter electrode (124).
申请公布号 US5616508(A) 申请公布日期 1997.04.01
申请号 US19950370137 申请日期 1995.01.09
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 JOHNSON, F. SCOTT
分类号 H01L29/73;H01L21/331;H01L21/8249;H01L27/06;H01L29/732;(IPC1-7):H01L21/265 主分类号 H01L29/73
代理机构 代理人
主权项
地址