APPARATUS FOR MEASURING CURRENT OF IC TESTER,申请号JP19950258137-传众专利搜索

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发明名称	APPARATUS FOR MEASURING CURRENT OF IC TESTER
摘要
申请公布号	JPH0980114(A)	申请公布日期	1997.03.28
申请号	JP19950258137	申请日期	1995.09.11
申请人	ADVANTEST CORP	发明人	HASHIMOTO YOSHIHIRO
分类号	G01R31/26;G01R19/00;(IPC1-7):G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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