发明名称 SEMICONDUCTOR WAFER TEMPERATURE CONTROLLER
摘要 <p>PROBLEM TO BE SOLVED: To make it possible to set the temperature of a wafer over a wide range of a high temperature at which the wafer is easily deformable to a low temperature in a wafer temperature controller and to make the temperature in the wafer surface uniform. SOLUTION: A current is suppled to a wafer 10 via a support member 1 to generate Joule heat to control to uniformly heat the surface of the wafer 10. The member 1 is lowered to bring the wafer 10 into direct contact with a stage 3 to be able to quickly cool it. Thus, the temperature of the wafer 10 can be controlled from the high temperature to the low temperature.</p>
申请公布号 JPH0982785(A) 申请公布日期 1997.03.28
申请号 JP19950238013 申请日期 1995.09.18
申请人 NEC CORP 发明人 INAGAKI NAOKI
分类号 H01L21/302;H01L21/22;H01L21/3065;H01L21/324;H01L21/68;H01L21/683;(IPC1-7):H01L21/68;H01L21/306 主分类号 H01L21/302
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