SYSTEM FOR CONTROLLING, MONITORING AND TESTING ELECTRIC TEST CIRCUITS,申请号PL19930300096-传众专利搜索

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发明名称	SYSTEM FOR CONTROLLING, MONITORING AND TESTING ELECTRIC TEST CIRCUITS
摘要
申请公布号	PL171187(B1)	申请公布日期	1997.03.28
申请号	PL19930300096	申请日期	1993.08.16
申请人	BACZYNSKI JANUSZ	发明人	BACZYNSKI JANUSZ
分类号	G01R31/28;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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